Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis
نویسندگان
چکیده
منابع مشابه
Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis
This paper proposes a novel and an efficient method termed hypersphere sampling to estimate the circuit yield of low-failure probability with a large number of variable sources. Importance sampling using a mean-shift Gaussian mixture distribution as an alternative distribution is used for yield estimation. Further, the proposed method is used to determine the shift locations of the Gaussian dis...
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ژورنال
عنوان ژورنال: IEICE Transactions on Electronics
سال: 2014
ISSN: 0916-8524,1745-1353
DOI: 10.1587/transele.e97.c.280